This white paper describes methods on detection and correction of both permanent (hard) and transient (soft) errors in memory. The transient errors are due to bit flips mainly from Neutron particles passing through silicon die, allowing detection and correction to occur removing the fault. Memories impacted by these transient errors include DRAM, FPGA configuration and logic memory blocks, SRAM, and memory contained in microcontrollers. Why these errors occur, how often they could occur given the size of memory, and how to mitigate the errors are described. exida has repeatedly found that the soft transient errors are the top contributors to dangerous undetected faults prior to applying mitigation measures.