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Using B10d Cycle Test Failure Data in SIF Verification - High Demand Only!

Recording Date: December 2012

Using B10d Cycle Test Failure Data in SIF Verification - High Demand Only!

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About the Presenter:

Dr. William Goble, CFSE

Dr. William Goble Dr. Goble has over 40 years of professional experience. He is widely recognized as an expert in programmable electronic systems analysis, safety and high availability automation systems, automation systems new product development and market analysis. He developed many of the techniques used for probabilistic evaluation of safety and high availability automation systems. He has published many papers and magazine articles. Dr. Goble has a BSEE from Penn State, a MSEE from Villanova and a PhD from Eindhoven University of Technology in Eindhoven, Netherlands.