A given Safety Instrumented Function (SIF) design must be verified to meet the required SIL level by checking systematic capability, architecture constraints and probability of failure on demand. Two of these checks require the failure rate data for each device. Fortunately, many device manufacturers are getting their products certified per IEC 61508 and many of the certificates now have failure rate data. Others supply analysis reports with failure rate data. All such data must be checked to make certain it is applicable for the process industries as some data has been derived based on machine safety or automotive applications.
This webinar will show some examples of manufacturer provided failure rate data and a methodology created to validate device type failure rate data for the process industries.
Loren Stewart graduated from Virginia Tech with a BSME. She has over 10 years of professional experience. She currently works for exida consulting as a safety engineer, focusing on the mechanical aspects of their customers. Along with assessing the safety of products and creating FMEDAs and reports, she researches stiction and is creating a database for the 2H initiative according to IEC 61508.