IEC 61511:2016 has strong language requiring failure rate data used in SIF verification to have a good pedigree. This language comes as a defense against extremely low failure rate data published by some manufacturers. This webinar will explain the sources of failure rate data and the tradeoffs in various methods being used to generate that data. A multi-method approach will be explained which can provide realistic, application specific failure rate data. Field failure statistical limits will be presented.
exida Recorded Webinars
Getting Good Failure Rate Data (IEC 61511:2016)
Recording Date: December 2016
About the Presenter:
Dr. William Goble, CFSE
Dr. Goble has over 40 years of professional experience. He is widely recognized as an expert in programmable electronic systems analysis, safety and high availability automation systems, automation systems new product development and market analysis. He developed many of the techniques used for probabilistic evaluation of safety and high availability automation systems. He has published many papers and magazine articles. Dr. Goble has a BSEE from Penn State, a MSEE from Villanova and a PhD from Eindhoven University of Technology in Eindhoven, Netherlands.